ข้อมูลทรัพยากร

เนื้อหาย่อ : The ability to predict circuit and system reliability is becoming increasingly im- portant due to the mounting awareness of product reliability by the government and by the informed public. In most cases, efforts are concentrated on the predic- tion of the probability of catastrophic failures, whereas the probability of system or circuit failure caused by the gradual deterioration of its subsystems or compon- ents has been shown only secondary interest. In many cases this viewpoint is justifed, but a number of important situations occur where component drift must be properly taken into account when estimating the reliability of the system. Of special significance is the fact that the techniques employed in computing mar- ginal reliability (also called drift reliability) are the same as those used in comput- ing the yield at the time of production. The yield or tolerancing problem is therefore stressed in this book, and the ultimate goal we pursue is the optimization of yield or drift reliability. Although the examples in the book are taken largely from the field of electrical engineering, the problem formulation and the solution methods are quite general and apply to other fields of engineering as well. The material presented in this book falls naturally into three parts. The first part, Chaps. 1 through 4, introduces the problem of optimization of yield or drift reliability (Chap. 1) and gives a brief account of some basic reliability concepts (Chap. 2). Chapter 3 is concerned with the discipline of design. A number of concepts are defined, and the design problem is formulated in a manner that lends itself to solution by computer techniques. Some fundamental reliability ideas are discussed in Chap. 4, which lead to the formulation of a yield (or drift reliability) model. The model takes the form of an integration of probability mass over a permissible region in input-parameter space.